LIGO Document E1100023-v1
YAG-444A (single element, not quad), 1060nm enhanced diode
EG&G Optoelectronics Canada (aka Excelitas Canada Inc.; both EG&G and Excelitas are business units within Perkin Elmer Corp.) Distributed by Pacer
scattered light in-vacuum photodetection; mounted on the Arm Cavity Baffle (ACB) assembly
- package is gold-plated kovar
- will not disclose the epoxy used in package (company proprietary information) without a non-disclosure agreement in place.
- The commercial product’s marking uses an ink that may outgas. EG&G uses a different ink for space-bound devices to avoid outgasing.
Typically, following a specific vacuum bake procedure (different for different product and internal volumes), the manufacturer performs the seal under a 100% nitrogen environment at a specific pressure.
The devices are seam sealed, but for the standard commercial part a leak test is not performed. For military or space-bound devices, we typically perform additional testing, not limited to a seam seal leak test. The manufacturer performs a standard leak test, fine and gross leak, on most products, but NOT on the YAG-444AH (and likely NOT on the YAG-444A). Fine leak testing is used to reject all parts with leak over 5 X 10^-8 atm cc/s He -- but again NOT for the YAG-444.
Since we do not know how reliable the seal is, we will vacuum test with the diode cans vented (hole(s) in can or lid/window removed).
Number of devices to be tested:
* ~ ˝ the intended amount in the vertex vacuum volume (single IFO), or
* ~ 2 times the intended amount in the end station vacuum volume
There are 4 diodes used per Arm Cavity Baffle, so this implies testing ~8 units. We will test 7 units. (Leaving 4 units from the initial order of 10, plus 1 replacement for a unit received with a broken window; These 4 units can be installed into an Arm Cavity Baffle.)
DCC Version 3.2.2, contact
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