LIGO Document T0900186-v1

Optical Dark Field Microscopy with First Contact

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T - Technical notes
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Evaluates whether there are enough defects to focus on after cleaning a surface with First Contact. It is hard to focus after FC cleaning. Conclude that before we buy an automated-autofocus microscope for defect binning, we send both known samples (all the same) and FC supply to the scope vendors to make sure the system will still work.

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