LIGO Document G1700301-v1
- We report here, based on our repeated measurements on various kind of thin film samples on silicon cantilevers, error patterns of cryogenic mechanical loss measurement in cantilever ring-down method from 10K to room temperature. We found that the measured cryogenic loss is highly repeatable with temperature re-cycling from 10K to room temperature. While on re-clamping, the measured loss is highly repeatable from 10K to ~100K, but less repeatable at elevated temperature; non-repeatable loss peaks appear with different clamping at the elevated temperature. With careful alignment during the sample-clamp assembling process, problem improved. Re-clamping with careful alignment is necessary to ensure that the peaks presented in the temperature range above ~100K are real.
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